First author: Department of Plant Pathology; second and third authors: Department of Crop and Soil Sciences; and fourth author: Department of Plant Pathology, Washington State University, Pullman 99164
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Accepted for publication 29 April 2004.
Wheat (Thinopyrum ponticum line SS767; PI 611939) with 42 chromosomes previously was identified as a new source of eyespot resistance. Individual plants of SS767 were tested for reaction to Tapesia yallundae, the major pathogen of eyespot in the Pacific Northwest region of the United States. Resistance of this line was similar to the resistant winter wheat cv. Madsen (carrying gene Pch1 for eyespot resistance). Polymerase chain reaction analysis with primers specific for the J or E genomes revealed that SS767 contains Thinopyrum chromatin. Cytological and Cbanding analyses demonstrated that SS767 is a chromosome substitution line in which wheat chromosome 4D is replaced by a homoeologous group 4 chromosome of Thinopyrum ponticum. Genomic in situ hybridization using St genomic DNA from Pseudoroegneria strigosa as a probe, which can differentiate chromosomes from different genomes of Thinopyrum, indicated that this chromosome belongs to the J genome. Molecular analysis of an F2 population segregating for chromosome 4J and resistance to eyespot confirmed that eyespot resistance in line SS767 is associated with chromosome 4J of Thinopyrum ponticum. This is the first report of genetic control of resistance to eyespot derived from Thinopyrum ponticum. This source of resistance provides a new opportunity to improve wheat resistance to eyespot by adding to the diversity of resistance sources available.
blue kernel color,
© 2004 The American Phytopathological Society