Previous View
APSnet Home
Phytopathology Home



Inheritance of Resistance to Anthracnose Leaf Blight in Five Inbred Lines of Corn. M. L. Carson, Former graduate research assistant, Department of Plant Pathology, University of Illinois, Urbana 61801, Present title and address of senior author: Assistant professor, Department of Plant Science, South Dakota State University, Brookings 57007; A. L. Hooker, professor, Department of Plant Pathology, University of Illinois, Urbana 61801. Phytopathology 71:488-491. Accepted for publication 23 September 1980. Copyright 1981 The American Phytopathological Society. DOI: 10.1094/Phyto-71-488.

Parent inbred lines, F1, F2, and backcross generations from five corn crosses were evaluated in the field for reaction to anthracnose leaf blight (ALB) which is caused by Colletotrichum graminicola. The crosses involved the susceptible inbred Oh07B crossed with resistant inbred lines H55, H84, Pa91, Pa762, and Syn B High-3. Individual plants were rated for reaction on the basis of percent leaf tissue infected. Generation mean analysis indicated that additive genetic effects were of primary importance in four of the five families. Resistance appeared to be controlled by a few (two to four) dominant genes. Mass selection, pedigree, and backcross breeding methods should all be effective means of breeding for resistance to ALB.

Additional keywords: Zea mays, maize.