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Disease Detection and Losses

Multiple Regression Accounting for Wheat Yield Reduction by Septoria nodorum and Other Pathogens. L. R. Nelson, Assistant Professors of Agronomy, University of Georgia College of Agriculture Experiment Stations, Experiment, GA 30212; M. R. Holmes(2), and B. M. Cunfer(3). (2)(3)Agricultural Economics, and Plant Pathology, respectively, University of Georgia College of Agriculture Experiment Stations, Experiment, GA 30212. Phytopathology 66:1375-1379. Accepted for publication 25 May 1976. Copyright © 1976 The American Phytopathological Society, 3340 Pilot Knob Road, St. Paul, MN 55121. All rights reserved.. DOI: 10.1094/Phyto-66-1375.

During 1973-74 and 1974-75 severe natural infection of wheat by Septoria nodorum occurred in Georgia. Numerous cultivars were evaluated for disease severity and the effect of the pathogen on various yield components. A Septoria disease index (SDI) was derived from these data. The SDI correlated with yield, 1,000-kernel weight, test weight, and plant height. Multiple regression equations were utilized to predict yield from disease severity caused by S. nodorum, Erysiphe graminis f. sp. tritici, Puccinia recondita f. sp. triticina, and several agronomic factors. When 1,000-kernel weight was included in an equation with SDI and E. graminis, 81% of the yield variation could be explained. Correlation coefficients involving SDI and yield were improved when SDI was squared and/or divided by each cultivarís mean plant height.

Additional keywords: glume blotch, leaf rust, powdery mildew, Triticum aestivum.