VIEW ARTICLE

Model for Yield Loss Determination of Bacterial Blight of Field Beans Utilizing Aerial Infrared Photography Combined With Field Plot Studies. V. R. Wallen, Ottawa Research Station, Research Branch, Agriculture Canada, Ottawa, Ontario K1A 0C6; H. R. Jackson, Research Program Services Section, Research Branch, Agriculture Canada, Ottawa, Ontario K1A 0C6. Phytopathology 65:942-948. Accepted for publication 6 January 1975. DOI: 10.1094/Phyto-65-942.

A model for the assessment of yield losses from bacterial blight (caused by Xanthomonas phaseoli) of field beans is described. The model uses a yield-loss factor of 38 determined from the average yield loss in 2-year field-plot trials, combined with results on the incidence of bacterial blight in commercial bean fields as determined by aerial infrared photographic surveys conducted in 1968, 1970, and 1972 in Ontario. Losses for the field-bean crop in Ontario varied from a high of over 1,251,913 kg (46,000 bu) in 1970, to a low of 217,724 kg (8,000 bu) in 1972.