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A Rating System for Determining Soybean Yield Reduction by Cephalosporium gregatum. L. E. Gray, Research Plant Pathologist, Crops Research Division, ARS, USDA, University of Illinois, Urbana 61801; P. N. Thapliyal(2), and J. B. Sinclair(3). (2)(3)AID Financed Participant, and Professor of Plant Pathology, respectively, University of Illinois, Urbana 61801. Phytopathology 60:1024. DOI: 10.1094/Phyto-60-1024.

A three-class system for field surveys of brown stem rot of soybeans is proposed. On the basis of the rating system, plants rated in the third class yielded significantly less than plants in the first and second classes.

Additional keywords: Brown stem rot of soybean.